We Can Figure This Out.org
Virtual Lab: Atomic Force Microscope (AFM)
University of Virginia
© 2003-Present, John C. Bean
The probe is held at the bottom of a small moveable tripod (more about this later).

The probe is precisely shaped by a process called silicon micromachining. This process combines photographic patterning with chemical etching to shape silicon along precise crystallographic planes.

The actual measuring point of the probe is the small downward facing point near the end of the small cantilever at the right. This point is almost atomically sharp.

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